Features

• Higher data quality; 32 bits per pixel, unlimited number of reflections in lattice parameter refinement

• Use of elliptical reflection profile for simulating the α1/α2 splitting during integration process

• More use of GUI during measurement and data processing, leading to better control, earlier and deeper in-sight into the data

• More flexibility due to dynamic memory management

• Full integration of STOE's FaceitVideo

Data Acquisition

• Intuitive interface to the diffractometer, offering direct access to all functions

• Easy centering of the sample with the aid of the integrated FaceitVideo function

• Automated data collection is started with just a few steps in the measuring program

• Frames with 32 bits per pixel facilitate high data accuracy

• User-friendly GUI optimizes the run strategy (e.g. in terms of high data completeness according to the crystal system and orientation), allowing faster and more dedicated collection of the data